THE MOBILITY OF NA+, LI+, AND K+ IONS IN THERMALLY GROWN SIO2-FILMS

[1] Anderson O. L., 1954, J AM CERAM SOC, V37, P573, DOI [DOI 10.1111/J.1151-2916.1954.TB13991.X, 10.1111/j.1151-2916.1954.tb13991.x]

[2] BIERSACK JP, 1982, ION IMPLANTATION TEC, P157

[3] KINETIC-BEHAVIOR OF MOBILE IONS IN THE AL-SIO2-SI SYSTEM [J]. JOURNAL OF APPLIED PHYSICS, 1979, 50 (02) : 942 - 950

[4] INFLUENCE OF ANNEAL TEMPERATURE ON THE MOBILE ION CONCENTRATION IN MOS STRUCTURES [J]. SOLID-STATE ELECTRONICS, 1984, 27 (01) : 77 - 81

[5] THEORETICAL SOLUTION OF THE TRANSIENT CURRENT EQUATION FOR MOBILE IONS IN A DIELECTRIC FILM UNDER THE INFLUENCE OF A CONSTANT ELECTRIC-FIELD [J]. JOURNAL OF APPLIED PHYSICS, 1984, 55 (09) : 3371 - 3375

[6] GREEUW G, 1984, THESIS STATE U GRONI

[7] MOBILITY OF POTASSIUM-IONS IN SIO2 [J]. JOURNAL OF APPLIED PHYSICS, 1979, 50 (07) : 4834 - 4837

[8] SPACE-CHARGE-LIMITED IONIC CURRENTS IN SILICON DIOXIDE FILMS [J]. APPLIED PHYSICS LETTERS, 1967, 10 (10) : 291 - +

[9] DIRECT MEASUREMENT OF NA+ ION MOBILITY IN SIO2-FILMS [J]. THIN SOLID FILMS, 1976, 36 (02) : 435 - 439

[10] NICOLLIAN EH, 1982, MOS METAL OXIDE SEMI, P759

[1] Anderson O. L., 1954, J AM CERAM SOC, V37, P573, DOI [DOI 10.1111/J.1151-2916.1954.TB13991.X, 10.1111/j.1151-2916.1954.tb13991.x]

[2] BIERSACK JP, 1982, ION IMPLANTATION TEC, P157

[3] KINETIC-BEHAVIOR OF MOBILE IONS IN THE AL-SIO2-SI SYSTEM [J]. JOURNAL OF APPLIED PHYSICS, 1979, 50 (02) : 942 - 950

[4] INFLUENCE OF ANNEAL TEMPERATURE ON THE MOBILE ION CONCENTRATION IN MOS STRUCTURES [J]. SOLID-STATE ELECTRONICS, 1984, 27 (01) : 77 - 81

[5] THEORETICAL SOLUTION OF THE TRANSIENT CURRENT EQUATION FOR MOBILE IONS IN A DIELECTRIC FILM UNDER THE INFLUENCE OF A CONSTANT ELECTRIC-FIELD [J]. JOURNAL OF APPLIED PHYSICS, 1984, 55 (09) : 3371 - 3375

[6] GREEUW G, 1984, THESIS STATE U GRONI

[7] MOBILITY OF POTASSIUM-IONS IN SIO2 [J]. JOURNAL OF APPLIED PHYSICS, 1979, 50 (07) : 4834 - 4837

[8] SPACE-CHARGE-LIMITED IONIC CURRENTS IN SILICON DIOXIDE FILMS [J]. APPLIED PHYSICS LETTERS, 1967, 10 (10) : 291 - +

[9] DIRECT MEASUREMENT OF NA+ ION MOBILITY IN SIO2-FILMS [J]. THIN SOLID FILMS, 1976, 36 (02) : 435 - 439

[10] NICOLLIAN EH, 1982, MOS METAL OXIDE SEMI, P759