INTERFACE ANALYSIS BY SPECTROSCOPIC ELLIPSOMETRY OF GA1-XALXAS-GAAS HETEROJUNCTIONS GROWN BY METAL ORGANIC VAPOR-PHASE EPITAXY

被引：13
作者：
ERMAN, M
FRIJLINK, PM
机构：
来源：
APPLIED PHYSICS LETTERS | 1983年 / 43卷 / 03期
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D O I：
10.1063/1.94328
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
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页码：285 / 287
页数：3
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