PHOTON-EMISSION INDUCED BY THE SCANNING TUNNELING MICROSCOPE

被引：0
作者：
BERNDT, R
机构：
来源：
SCANNING MICROSCOPY | 1995年 / 9卷 / 03期
关键词：
SCANNING TUNNELING MICROSCOPY; INELASTIC TUNNELING; LUMINESCENCE; AU(110);
D O I：
暂无
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
By using the tip of a scanning tunneling microscope (STM) as a local source for electrons (or holes) light emission can be excited from metals, semiconductors and molecules. Using this technique, it is possible to combine the high spatial resolution of STM with optical techniques. We review results obtained using a variety of modes of measurements including fluorescence spectroscopy, isochromat spectroscopy and simultaneous mapping of photon emission and surface topography. In spatial maps of the photon emission, clear contrasts are observed with lateral resolutions below 1 nm which are related to the geometric and electronic structure of the sample and the tip. In particular, recent results on atomic resolution of Au(110) are discussed to highlight the important role of the electromagnetic interaction of the tip and the sample for the observed photon emission.
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页码：687 / 693
页数：7
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