ELECTRICAL CONDUCTION THROUGH SIO FILMS

被引:130
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HARTMAN, TE
BLAIR, JC
BAUER, R
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10.1063/1.1708838
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O59 [应用物理学];
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页码:2468 / &
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[1]   PHOTOEMISSIVE DETERMINATION OF BARRIER SHAPE IN TUNNEL JUNCTIONS [J].
BRAUNSTE.A ;
BRAUNSTE.M ;
PICUS, GS ;
MEAD, CA .
PHYSICAL REVIEW LETTERS, 1965, 14 (07) :219-&
[2]  
DRUMHELLER CE, 1963, ASDTDR63519
[3]  
DRUMHELLER CE, 1960, FEB KEM CO RES REP
[4]  
DRUMHELLER CE, 1961, VACUUM S T, P306
[5]   SCHOTTKY EMISSION THROUGH THIN INSULATING FILMS [J].
EMTAGE, PR ;
TANTRAPORN, W .
PHYSICAL REVIEW LETTERS, 1962, 8 (07) :267-&
[6]   The analysis of photoelectric sensitivity curves for clean metals at various temperatures [J].
Fowler, RH .
PHYSICAL REVIEW, 1931, 38 (01) :45-56
[7]  
Frenkel J, 1938, PHYS REV, V54, P647, DOI 10.1103/PhysRev.54.647
[8]  
FRENKEL J, 1938, ZH EKSPERIM TEOR FIZ, V8, P1893
[9]  
FROHLICH H, 1947, P ROY SOC LONDON, VA188, P521