MICROSTRUCTURE, FLUX-PINNING AND CRITICAL-CURRENT DENSITY IN YBA2CU3O7-DELTA FILMS GROWN BY LASER-ABLATION

被引：11
作者：
MISRA, DS
PADALIA, BD
PAI, SP
PINTO, R
PALMER, SB
机构：
[1] TATA INST FUNDAMENTAL RES, BOMBAY 400005, INDIA
[2] UNIV WARWICK, DEPT PHYS, COVENTRY CV4 7AL, W MIDLANDS, ENGLAND
来源：
THIN SOLID FILMS | 1994年 / 245卷 / 1-2期
关键词：
D O I：
10.1016/0040-6090(94)90897-4
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Thin films of YBa2Cu3O7-delta (YBCO) are deposited by laser ablation at substrate temperatures (T(s)) ranging from 575 to 850-degrees-C. The microstructure and growth behaviour of the films are found to be a sensitive function of T(s). We also find that the critical current density (J(c)) of the films is strongly related to the microstructure. It is proposed that the boundaries between a-axis and c-axis grains may act as pinning centres.
引用
收藏
页码：186 / 190
页数：5
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