FORMATION OF MULTIATOMIC CLUSTER IONS OF SILICON IN PULSED-LASER STIMULATED FIELD DESORPTION

被引:67
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TSONG, TT
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10.1063/1.95018
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O59 [应用物理学];
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页码:1149 / 1151
页数:3
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共 9 条
[1]  
COLTON RJ, 1983, NUCLEAR INSTRUM METH, V218
[2]  
DRACHSEL W, 1982, 29TH P INT FIELD EM, P299
[3]   CRITICAL SIZES FOR STABLE MULTIPLY CHARGED CO2 CLUSTERS [J].
ECHT, O ;
SATTLER, K ;
RECKNAGEL, E .
PHYSICS LETTERS A, 1982, 90 (04) :185-189
[4]   PULSED LASER ATOM-PROBE STUDY OF CLEAN AND OXYGEN-COVERED SILICON [J].
KELLOGG, GL .
APPLICATIONS OF SURFACE SCIENCE, 1982, 11-2 (JUL) :186-195
[5]  
Muller E., 1974, PROG SURF SCI, V4, P1
[6]   EVIDENCE FOR COULOMB EXPLOSION OF DOUBLY CHARGED MICROCLUSTERS [J].
SATTLER, K ;
MUHLBACH, J ;
ECHT, O ;
PFAU, P ;
RECKNAGEL, E .
PHYSICAL REVIEW LETTERS, 1981, 47 (03) :160-163
[7]   METHODS FOR A PRECISION-MEASUREMENT OF IONIC MASSES AND APPEARANCE ENERGIES USING THE PULSED-LASER TIME-OF-FLIGHT ATOM PROBE [J].
TSONG, TT ;
LIOU, Y ;
MCLANE, SB .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1984, 55 (08) :1246-1254
[8]   PULSED-LASER TIME-OF-FLIGHT ATOM-PROBE FIELD-ION MICROSCOPE [J].
TSONG, TT ;
MCLANE, SB ;
KINKUS, TJ .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1982, 53 (09) :1442-1448
[9]  
TSONG TT, UNPUB PHYS REV B