SIMULTANEOUS ELECTRON AND X-RAY-ANALYSIS AND ITS APPLICATION IN CORROSION SCIENCE

被引：10

作者：

CASTLE, JE

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1983年 / 1卷 / 02期

关键词：

D O I：

10.1116/1.572329

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：1013 / 1020

页数：8

共 10 条

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[3]

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[6] XPS STUDY OF THE BEHAVIOR OF THE PROTECTIVE LAYER ON ALUMINUM-BRASS CONDENSER TUBES [J].

EPLER, DC ;

CASTLE, JE .

CORROSION, 1979, 35 (10) :451-455

[7]

HERGLOTZ HK, 1974, ADV XRAY ANAL, V17, P509

[8] SPUTTERING OF AMORPHOUS SILICON FILMS BY 0.5 TO 5-KEV AR+ IONS [J].

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ETZKORN, HW .

APPLIED SURFACE SCIENCE, 1979, 3 (02) :251-271

[9] DETECTION OF MONOLAYER QUANTITIES OF OXYGEN ON SILICON USING ENERGY-DISPERSIVE X-RAY SPECTROMETRY [J].

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STRAUSSER, YE .

APPLIED PHYSICS LETTERS, 1980, 37 (05) :478-480

[10]

Seah M. P., 1979, Surface and Interface Analysis, V1, P2, DOI 10.1002/sia.740010103

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