IN-DEPTH INFORMATION FROM AUGER-ELECTRON SPECTROSCOPY

被引：14

作者：

MEYER, F ^{[1
]}

VRAKKING, JJ ^{[1
]}

机构：

[1] PHILIPS RES LABS,EINDHOVEN,NETHERLANDS

来源：

SURFACE SCIENCE | 1974年 / 45卷 / 02期

关键词：

D O I：

10.1016/0039-6028(74)90178-2

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：409 / 418

页数：10

共 18 条

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[4]

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[6] ELLIPSOMETRY AND CLEAN SURFACES OF SILICON AND GERMANIUM [J].

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[7] MEASUREMENT OF IONIZATION CROSS-SECTION OF L23-SHELL OF CHLORINE USING AUGER-ELECTRON SPECTROSCOPY [J].

MEYER, F ;

VRAKKING, JJ .

PHYSICS LETTERS A, 1973, A 44 (07) :511-512

[8] QUANTITATIVE ASPECTS OF AUGER-ELECTRON SPECTROSCOPY [J].

MEYER, F ;

VRAKKING, JJ .

SURFACE SCIENCE, 1972, 33 (02) :271-&

[9] USE OF AUGER-ELECTRON SPECTROSCOPY AND INERT-GAS SPUTTERING FOR OBTAINING CHEMICAL PROFILES [J].

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[10] OPTIMIZATION OF AUGER ELECTRON SPECTROSCOPY IN LEED SYSTEMS [J].

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