EFFECT OF NUCLEAR RADIATION ON THE ELECTRICAL-PROPERTIES OF CHEMICAL DOUBLE-LAYER CAPACITORS

被引:1
作者
LAGHARI, JR
HAMMOUD, AN
机构
[1] Department of Electrical and Computer Engineering, State University of New York at Buffalo, Buffalo, NY 14260
[2] Sverdrup Technology Inc., NASA Lewis Research Center Group, Cleveland
关键词
D O I
10.1109/23.106756
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The effects of nuclear radiation on the electrical properties of chemical double layer capacitors are determined. The capacitors were irradiated in a 2-MW nuclear reactor to different fluence levels. The exposure rate was 2.2 × 1010 n/cm2·s of thermal neutrons, 9.52 × 108 n/cm2·s of fast neutrons (>3 MeV), and 1.47 × 106 rad/h of gamma radiation. The properties which were measured during and after irradiation included the capacitance, equivalent series resistance, and open-circuit voltage. The post-irradiation effect on the leakage current was also determined. It was found that while the capacitance increased during irradiation, the equivalent series resistance and the open-circuit voltage decreased slightly during irradiation. Changes in these properties, however, were not permanent as was evident from post-irradiation measurements. The leakage current did not show any significant change with radiation. The results indicate that chemical double layer capacitors can be suitably used as backup power source in electronic equipment operating in a radiation environment with total fluences up to 4.05 × 1014 n/cm2. Copyright © 1990 by The Institute of Electrical and Electronics Engineers, Inc.
引用
收藏
页码:1072 / 1075
页数:4
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