USE OF KINEMATICAL DIFFRACTION IN X-RAY TOPOGRAPHY

被引：4
|
作者：
ALEXANDROPOULOS, NG
KOTSIS, KT
机构：
来源：
JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1985年 / 18卷 / DEC期
关键词：
D O I：
10.1107/S0021889885010792
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
引用
收藏
页码：509 / 512
页数：4
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