ANOMALOUS BREAKDOWN PHENOMENA IN PMMA UNDER COMBINED DIRECT AND IMPULSE STRESSES

被引:1
作者
EISH, TD
VENKATASESHAIAH, C
RAO, YN
机构
来源
IEEE TRANSACTIONS ON ELECTRICAL INSULATION | 1982年 / 17卷 / 04期
关键词
D O I
10.1109/TEI.1982.298511
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:368 / 372
页数:5
相关论文
共 50 条
[41]   FATIGUE UNDER COMBINED PULSATING STRESSES [J].
MAJORS, H ;
MILLS, BD ;
MACGREGOR, CW .
JOURNAL OF APPLIED MECHANICS-TRANSACTIONS OF THE ASME, 1949, 16 (03) :269-276
[42]   FATIGUE UNDER COMBINED PULSATING STRESSES [J].
DOLAN, TJ ;
FRAENKEL, SJ ;
MAJORS, H .
JOURNAL OF APPLIED MECHANICS-TRANSACTIONS OF THE ASME, 1950, 17 (02) :218-221
[43]   DIRECT CURRENT PRE-BREAKDOWN PHENOMENA IN LIQUID NITROGEN [J].
COELHO, R ;
SIBILLOT, P .
NATURE, 1969, 221 (5182) :757-+
[44]   PLASTIC ANALYSIS UNDER COMBINED STRESSES [J].
GRIERSON, DE ;
ABDELBASET, SB .
JOURNAL OF THE ENGINEERING MECHANICS DIVISION-ASCE, 1977, 103 (05) :837-854
[45]   PLASTIC DESIGN UNDER COMBINED STRESSES [J].
GRIERSON, DE ;
ALY, AA .
JOURNAL OF THE ENGINEERING MECHANICS DIVISION-ASCE, 1980, 106 (04) :585-607
[46]   Magnetotransport phenomena in layered conductors under magnetic breakdown [J].
Galbova, O. ;
Peschansky, V. G. ;
Stepanenko, D. I. .
INTERNATIONAL JOURNAL OF MODERN PHYSICS B, 2017, 31 (14)
[47]   Breakdown in compressed N-2 under impulse voltages [J].
Ismailoglu, H ;
Kalenderli, O ;
Ozkaya, M ;
Gonenc, I .
IEEE 1997 ANNUAL REPORT - CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA, VOLS I AND II, 1997, :604-607
[48]   Breakdown Characteristics of Transformer Oil Under Bipolar Oscillating Impulse [J].
Ni H. ;
Zhang Q. ;
Zhao Y. ;
Guo N. ;
Fan X. ;
Liu X. .
Gaodianya Jishu/High Voltage Engineering, 2019, 45 (12) :3827-3835
[49]   BREAKDOWN OF LARGE VACUUM GAPS UNDER LIGHTNING IMPULSE STRESS [J].
BENDER, HG ;
KARNER, HC .
IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1988, 23 (01) :37-42
[50]   Prediction of breakdown in SF6 under impulse conditions [J].
Xu, X ;
Jayaram, S ;
Boggs, SA .
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, 1996, 3 (06) :836-842