SINGLE-ELECTRON CHARGING EFFECTS AND IMPLICATIONS FOR TUNNELING MEASUREMENTS OF THE HIGH-TC SUPERCONDUCTORS

被引：4
|
作者：
BARNER, JB
MULLEN, K
HONKANEN, MJ
RUGGIERO, ST
BENJACOB, E
PELTON, AR
机构：
[1] UNIV MICHIGAN,DEPT PHYS,ANN ARBOR,MI 48109
[2] UNIV NOTRE DAME,DEPT MAT SCI & ENGN,NOTRE DAME,IN 46556
[3] TEL AVIV UNIV,SCH PHYS & ASTRON,IL-69978 TEL AVIV,ISRAEL
来源：
IEEE TRANSACTIONS ON MAGNETICS | 1989年 / 25卷 / 02期
关键词：
D O I：
10.1109/20.92824
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：2542 / 2545
页数：4
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