QUANTITATIVE-ANALYSIS OF INTENSITIES IN X-RAY TOPOGRAPHS BY ENHANCED MICROFLUORESCENCE

被引：0

作者：

WEISSMANN, S

GREENHUT, VA

CHAUDHURI, J

KALMAN, ZH

机构：

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1983年 / 16卷 / DEC期

关键词：

D O I：

10.1107/S0021889883011164

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

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页码：606 / 610

页数：5

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[1] MEASUREMENT OF STRESS GRADIENTS GENERATED BY ELECTROMIGRATION
BLECH, IA
TAI, KL
[J]. APPLIED PHYSICS LETTERS, 1977, 30 (08) : 387 - 389
[2] DETERMINATION OF THE STRAIN CONCENTRATION FACTORS AROUND HOLES AND INCLUSIONS IN CRYSTALS BY X-RAY TOPOGRAPHY
CHAUDHURI, J
KALMAN, ZH
WENG, GJ
WEISSMANN, S
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1982, 15 (AUG) : 423 - 429
[3] DETERMINATION OF STRAIN DISTRIBUTION IN ELASTICALLY BENT MATERIALS BY X-RAY-INTENSITY MEASUREMENT
KALMAN, ZH
WEISSMANN, S
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1979, 12 (APR) : 209 - 220
[4] DETERMINATION OF STRAIN CONCENTRATION BY MICROFLUORESCENT DENSITOMETRY OF X-RAY TOPOGRAPHY - A BRIDGE BETWEEN MICRO-FRACTURE AND CONTINUUM-MECHANICS
KALMAN, ZH
CHAUDHURI, J
WENG, GJ
WEISSMANN, S
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1980, 13 (JUN) : 290 - 296
[5] GRAIN-BOUNDARY ELECTROMIGRATION IN THIN-FILMS .2. TRACER MEASUREMENTS IN PURE AU
TAI, KL
OHRING, M
[J]. JOURNAL OF APPLIED PHYSICS, 1977, 48 (01) : 36 - 45