SOME CHARACTERISTICS OF DISTRIBUTION OF RADIATION DEFECTS RESULTING FROM IMPLANTATION OF BORON IONS IN SILICON

被引:0
作者
SKAKUN, NA [1 ]
DIKII, NP [1 ]
MATYASH, PP [1 ]
机构
[1] ACAD SCI UKSSR,ENGN PHYS INST,KHARKOV,UKSSR
来源
SOVIET PHYSICS SEMICONDUCTORS-USSR | 1975年 / 8卷 / 07期
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中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
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页码:854 / 855
页数:2
相关论文
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  • [1] GERASIMENKO NN, 1973, SOV PHYS SEMICOND+, V6, P1692
  • [2] GERASIMENKO NN, 1972, FIZ TEKH POLUPROV, V6, P1978
  • [3] PECULIARITIES OF SILICON AMORPHIZATION AT ION-BOMBARDMENT
    GERASIMOV, AI
    ZORIN, EI
    TETELBAUM, DI
    PAVLOV, PV
    [J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1972, 12 (02): : 679 - +
  • [4] Kumakhov M. A., 1971, Soviet Physics - Doklady, V16, P109
  • [5] KUMAKHOV MA, 1971, DOKL AKAD NAUK SSSR+, V196, P1300
  • [6] KUMAKHOV MA, 1973, SOV PHYS SEMICOND+, V6, P1350
  • [7] KUMAKHOV MA, 1972, FIZ TEKH POLUPROV, V6, P1564
  • [8] Pridachin N. B., 1971, Fizika i Tekhnika Poluprovodnikov, V5, P166
  • [9] PRIDACHIN NB, 1971, SOV PHYS SEMICOND+, V5, P142
  • [10] SKAKUN NA, 1973, PRIB TEKH EKSP, P49