INFRARED EXAMINATION OF MICRO SAMPLES - APPLICATION OF A SPECULAR REFLECTANCE SYSTEM

被引：6
作者：
SLOANE, HJ
JOHNS, T
ULRICH, WF
CADMAN, WJ
机构：
来源：
APPLIED SPECTROSCOPY | 1965年 / 19卷 / 04期
关键词：
D O I：
10.1366/000370265789619845
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
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页码：130 / &
相关论文
共 4 条
[1]   SILVER CHLORIDE BEAM CONDENSING LENS SYSTEM FOR MICRO INFRARED MEASUREMENTS [J].
ANDERSON, DH ;
MILLER, OE .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1953, 43 (09) :777-779
[2]   INFRARED IDENTIFICATION OF MATERIALS IN THE FRACTIONAL MILLIGRAM RANGE - BY MEANS OF A BEAM CONDENSING SYSTEM AND PRESSED POTASSIUM BROMIDE PELLETS CONTAINING THE SAMPLE [J].
ANDERSON, DH ;
WOODALL, NB .
ANALYTICAL CHEMISTRY, 1953, 25 (12) :1906-1909
[3]   INFRARED SPECTROSCOPY OF SURFACE COATINGS IN REFLECTED LIGHT [J].
DANNENBERG, H ;
FORBES, JW ;
JONES, AC .
ANALYTICAL CHEMISTRY, 1960, 32 (03) :365-370
[4]  
WOLBERT HJ, 1957, PERKINELMER INSTRUME, V8, P1
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