AUTOMATIC EQUIPMENT CHECKING SYSTEM

被引：0
作者：
CHALMERS, DA
机构：
来源：
ELECTRONIC ENGINEERING | 1975年 / 47卷 / 573期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：19 / &
相关论文
共 50 条
[41]   AUTOMATIC TEST DESIGN SYSTEM FOR DIGITAL ELECTRONIC EQUIPMENT [J].
PROKHOROV, DS ;
GRUDIN, AA ;
YURGENSON, DR .
MEASUREMENT TECHNIQUES USSR, 1990, 33 (08) :791-792
[42]   LORDS-AN AUTOMATIC DESIGN SYSTEM OF DIGITAL EQUIPMENT [J].
MURAYAMA, Y ;
SUYAMA, T .
NEC RESEARCH & DEVELOPMENT, 1971, (21) :38-&
[43]   WAY TO PROTECT THE AUTOMATIC CHECKING AND MEASURING EQUIPMENT AND THE LOGICAL UNIT UNDER INVESTIGATION FROM THE CURRENT OVERLOAD [J].
BELOGUB, VV ;
PRIHODKO, VI .
AVTOMATIKA I VYCHISLITELNAYA TEKHNIKA, 1979, (05) :66-69
[44]   METHOD OF PROTECTING AUTOMATIC CHECKING AND DIAGNOSTIC EQUIPMENT AND CHECKED LOGIC DEVICES FROM CURRENT OVERLOADS. [J].
Belogub, V.V. ;
Prikhod'ko, V.I. .
Automatic Control and Computer Sciences, 1979, 13 (05) :63-66
[45]   Automatic decomposition for sequential equivalence checking of system level and RTL descriptions [J].
Vasudevan, Shobha ;
Viswanath, Vinod ;
Abraham, Jacob A. ;
Tu, Jiajin .
FOURTH ACM & IEEE INTERNATIONAL CONFERENCE ON FORMAL METHODS AND MODELS FOR CO-DESIGN, PROCEEDINGS, 2006, :71-+
[46]   An automatic chip character checking system for circuit board quality control [J].
Wang, ZY ;
Li, YJ ;
Luo, ZM .
IECON'03: THE 29TH ANNUAL CONFERENCE OF THE IEEE INDUSTRIAL ELECTRONICS SOCIETY, VOLS 1 - 3, PROCEEDINGS, 2003, :1767-1770
[47]   Automatic fault-checking system on the DIII-D tokamak [J].
Scoville, JT ;
Walker, ML .
FUSION SCIENCE AND TECHNOLOGY, 2005, 47 (03) :774-778
[48]   CHECKING THE SYSTEM OF QUALITY PREDICTION IN CONCAST EQUIPMENT WHEN PRODUCING MICROALLOYED STEELS [J].
Masarik, Milos ;
Camek, Libor .
METAL 2013: 22ND INTERNATIONAL CONFERENCE ON METALLURGY AND MATERIALS, 2013, :159-165
[49]   Development of wireless automatic checking system for emergency lights via internet [J].
Lin, Hsiung-Cheng ;
Luo, Wei-Lun ;
Pai, Kuo-Hung ;
Liu, Liang-Yih .
Advances in Information Sciences and Service Sciences, 2012, 4 (18) :15-24
[50]   OPTIMIZING THE CHECKING DEPTH IN ELECTRONIC EQUIPMENT [J].
MARTYNENKO, ON ;
SERDAKOV, AS .
AUTOMATION AND REMOTE CONTROL, 1981, 42 (08) :1040-1043
12345