CRYSTALLINE EFFECTS IN AUGER-ELECTRON SPECTROSCOPY

被引:54
作者
BISHOP, HE
CHORNIK, B
LEGRESSUS, C
LEMOEL, A
机构
[1] UNIV SIMON BOLIVAR,CARACAS,VENEZUELA
[2] CENS,DEPT PHYSICOCHIM,SACLAY,FRANCE
关键词
D O I
10.1002/sia.740060304
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:116 / 128
页数:13
相关论文
共 32 条
[1]   ANGULAR-DISTRIBUTION OF AUGER EMISSION FROM ALUMINUM AND NICKEL SURFACES [J].
ALLIE, G ;
BLANC, E ;
DUFAYARD, D .
SURFACE SCIENCE, 1976, 57 (01) :293-305
[2]   EXPERIMENTAL STUDY OF INFLUENCE OF ANGLE OF INCIDENCE OF PRIMARY ELECTRONS ON PRODUCTION OF AUGER EMISSION [J].
ALLIE, G ;
BLANC, E ;
DUFAYARD, D ;
STERN, RM .
SURFACE SCIENCE, 1974, 46 (01) :188-196
[3]   DIFFRACTION EFFECTS IN BACKSCATTERING AND AUGER PRODUCTION NEAR CRYSTAL-SURFACES [J].
ANDERSEN, SK ;
HOWIE, A .
SURFACE SCIENCE, 1975, 50 (01) :197-214
[4]  
ARMITAGE AF, 1980, SURF SCI, V100, pL483, DOI 10.1016/0039-6028(80)90410-0
[5]   CRYSTALLINE EFFECTS IN BACKSCATTERING AND AUGER PRODUCTION [J].
BAINES, M ;
HOWIE, A ;
ANDERSEN, SK .
SURFACE SCIENCE, 1975, 53 (DEC) :546-553
[6]  
BARGERON CB, 1982, SURF SCI, V120, pL483, DOI 10.1016/0039-6028(82)90144-3
[7]   SUBSTRATE AND INSTRUMENTAL EFFECTS IN QUANTITATIVE AUGER-ELECTRON SPECTROSCOPY - THE SYSTEM LEAD ON GOLD [J].
BARTHES, MG ;
RHEAD, GE .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1980, 13 (05) :747-757
[8]  
BAUDOING R, 1983, SCANNING ELECTRON MI
[9]   ESTIMATES OF EFFICIENCIES OF PRODUCTION AND DETECTION OF ELECTRON-EXCITED AUGER EMISSION [J].
BISHOP, HE ;
RIVIERE, JC .
JOURNAL OF APPLIED PHYSICS, 1969, 40 (04) :1740-&
[10]   SOME COMMENTS ON INTERPRETATION OF KIKUCHI-LIKE REFLECTION PATTERNS OBSERVED BY SCANNING ELEECTRON MICROSCOPY [J].
BOOKER, GR ;
SHAW, AMB ;
WHELAN, MJ ;
HIRSCH, PB .
PHILOSOPHICAL MAGAZINE, 1967, 16 (144) :1185-&