DETERMINATION OF THE STRAIN CONCENTRATION FACTORS AROUND HOLES AND INCLUSIONS IN CRYSTALS BY X-RAY TOPOGRAPHY

被引：4

作者：

CHAUDHURI, J ^{[1
]}

KALMAN, ZH ^{[1
]}

WENG, GJ ^{[1
]}

WEISSMANN, S ^{[1
]}

机构：

[1] RUTGERS STATE UNIV,COLL ENGN,DEPT MECH & MAT SCI,PISCATAWAY,NJ 08854

来源：

关键词：

D O I：

10.1107/S0021889882012308

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：423 / 429

页数：7

共 19 条

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[8] DETERMINATION OF STRAIN CONCENTRATION BY MICROFLUORESCENT DENSITOMETRY OF X-RAY TOPOGRAPHY - A BRIDGE BETWEEN MICRO-FRACTURE AND CONTINUUM-MECHANICS
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