CRITICAL CURRENT-DENSITY MEASUREMENTS OF THIN-FILMS OF YBACUO

被引：1

作者：

ALLEN, LH

CLAASSEN, JH

BROUSSARD, PR

机构：

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1989年 / 25卷 / 02期

关键词：

D O I：

10.1109/20.92779

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：2345 / 2347

页数：3

共 6 条

[1]

BROUSSARD PR, 1989, IEEE MAGNET, V25

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[3]

HAMMOND RH, 1978, IEEE T MAGN, V15, P619

[4]

HWANG KF, 1978, IEEE T MAG, V15, P400

[5] ORDERED-DEFECT STRUCTURE IN EPITAXIAL YBA2CU3O7-X THIN-FILMS [J].

MARSHALL, AF ;

BARTON, RW ;

CHAR, K ;

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OH, B ;

HAMMOND, RH ;

LADERMAN, SS .

PHYSICAL REVIEW B, 1988, 37 (16) :9353-9358

[6] UPPER CRITICAL-FIELD AND RESISTIVITY OF SINGLE-CRYSTAL EUBA2CU3OY - DIRECT MEASUREMENTS UNDER HIGH-FIELD UP TO 50 T [J].

TAJIMA, Y ;

HIKITA, M ;

ISHII, T ;

FUKE, H ;

SUGIYAMA, K ;

DATE, M ;

YAMAGISHI, A ;

KATSUI, A ;

HIDAKA, Y ;

IWATA, T ;

TSURUMI, S .

PHYSICAL REVIEW B, 1988, 37 (13) :7956-7959

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