STRUCTURE AND COMPOSITION ANALYSIS OF SILICON ALUMINUM OXYNITRIDE POLYTYPES BY COMBINED USE OF STRUCTURE IMAGING AND MICROANALYSIS

被引:28
作者
BANDO, Y
MITOMO, M
KITAMI, Y
IZUMI, F
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D O I
10.1111/j.1365-2818.1986.tb02760.x
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TH742 [显微镜];
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页码:235 / 246
页数:12
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共 11 条
[1]  
[Anonymous], 1966, ACTA CRYSTALLOGR 4
[2]  
[Anonymous], 1977, NITROGEN CERAMICS
[3]   A 400 KV HIGH RESOLUTION-ANALYTICAL ELECTRON-MICROSCOPE NEWLY CONSTRUCTED [J].
BANDO, Y ;
MATSUI, Y ;
KITAMI, Y ;
INOMATA, Y ;
IBE, K ;
HONDA, T ;
HARADA, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1984, 23 (06) :L412-L414
[4]   THE USEFULNESS OF A 400 KV HIGH-RESOLUTION ANALYTICAL ELECTRON-MICROSCOPE [J].
BANDO, Y ;
MATSUI, Y ;
UEMURA, Y ;
OIKAWA, T ;
SUZUKI, S ;
HONDA, T ;
HARADA, Y .
ULTRAMICROSCOPY, 1985, 18 (1-4) :117-123
[5]  
BANDO Y, 1984, JEOL NEWS, V22, P28
[6]   SYMMETRY OF ELECTRON-DIFFRACTION ZONE AXIS PATTERNS [J].
BUXTON, BF ;
EADES, JA ;
STEEDS, JW ;
RACKHAM, GM .
PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1976, 281 (1301) :171-+
[7]   QUANTITATIVE-ANALYSIS OF THIN SPECIMENS [J].
CLIFF, G ;
LORIMER, GW .
JOURNAL OF MICROSCOPY-OXFORD, 1975, 103 (MAR) :203-207
[8]  
EGERTON RF, 1978, SCANNING ELECTRON MI, V1
[9]   CONTRIBUTION TO PHASE-DIAGRAM SI3N4-ALN-AL2O3-SIO2 [J].
GAUCKLER, LJ ;
LUKAS, HL ;
PETZOW, G .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1975, 58 (7-8) :346-347
[10]   SIALONS AND RELATED NITROGEN CERAMICS [J].
JACK, KH .
JOURNAL OF MATERIALS SCIENCE, 1976, 11 (06) :1135-1158