SEMICONDUCTOR-LASER FACET REFLECTIVITIES USING FREE-SPACE RADIATION MODES

被引：48
作者：
KENDALL, PC [1 ]
ROBERTS, DA [1 ]
ROBSON, PN [1 ]
ADAMS, MJ [1 ]
ROBERTSON, MJ [1 ]
机构：
[1] BT LABS,IPSWICH IP5 7RE,ENGLAND
来源：
IEE PROCEEDINGS-J OPTOELECTRONICS | 1993年 / 140卷 / 01期
关键词：
SEMICONDUCTOR DEVICES AND MATERIALS;
D O I：
10.1049/ip-j.1993.0009
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Free-space radiation modes are used to determine a new formula for the main mode reflectivity of a multicoated semiconductor laser facet at normal incidence. The results are shown to compare favourably with exact values, and to provide some unification for the Fresnel methods.
引用
收藏
页码：49 / 55
页数：7
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