FAIL-SAFE CIRCUITS FOR NUCLEAR PROTECTIVE SYSTEMS

被引：1

作者：

BUSINARO, T

CONTI, IL

CONTI, IM

机构：

来源：

关键词：

D O I：

10.1109/TNS.1964.4323386

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：64 / &

共 50 条

[31] FAILURE OF FAIL-SAFE
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