FAIL-SAFE CIRCUITS FOR NUCLEAR PROTECTIVE SYSTEMS

被引：1
|
作者：
BUSINARO, T
CONTI, IL
CONTI, IM
机构：
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1964年 / NS11卷 / 02期
关键词：
D O I：
10.1109/TNS.1964.4323386
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：64 / &
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