CALCULATIONS ON THE WAVELENGTH DEPENDENCE OF THE INTENSITY OF BACK-REFLECTED ELECTRONS FROM NICKEL (111)

被引：20
作者：
GAFNER, G
机构：
来源：
SURFACE SCIENCE | 1964年 / 2卷
关键词：
D O I：
10.1016/0039-6028(64)90097-4
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：534 / 543
页数：10
相关论文
共 7 条
[1]  
FARNSWORTH HE, IN PRESS
[2]   STUDY OF ADSORBED GAS FILMS BY ELECTRON DIFFRACTION [J].
GERMER, LH ;
SCHEIBNER, EJ ;
HARTMAN, CD .
PHILOSOPHICAL MAGAZINE, 1960, 5 (51) :222-&
[3]   REFLECTION AND DIFFRACTION OF SLOW ELECTRONS FROM SINGLE CRYSTALS OF TUNGSTEN [J].
KHAN, IH ;
ARMSTRONG, RA ;
HOBSON, JP .
PHYSICAL REVIEW, 1963, 129 (04) :1513-&
[4]   LOW-ENERGY ELECTRON DIFFRACTION STUDY OF SILICON SURFACE STRUCTURES [J].
LANDER, JJ ;
MORRISON, J .
JOURNAL OF CHEMICAL PHYSICS, 1962, 37 (04) :729-&
[5]   SCATTERING FACTORS AND OTHER PROPERTIES OF LOW-ENERGY ELECTRON DIFFRACTION [J].
LANDER, JJ ;
MORRISON, J .
JOURNAL OF APPLIED PHYSICS, 1963, 34 (12) :3517-&
[6]  
MACRAE AU, 1963, ANN NY ACAD SCI, V101, P627
[7]  
STURKEY J, 1962, P PHYS SOC LONDON, V80, P321
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