AES DEPTH PROFILE MEASUREMENTS OF NIOBIUM FOR SUPERCONDUCTING CAVITIES

被引：25
作者：
HAHN, H [1 ]
HALAMA, HJ [1 ]
机构：
[1] BROOKHAVEN NATL LAB,UPTON,NY 11973
来源：
JOURNAL OF APPLIED PHYSICS | 1976年 / 47卷 / 10期
关键词：
D O I：
10.1063/1.322390
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：4629 / 4634
页数：6
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