PHASE DETERMINATION FROM A FOCAL SERIES AND CORRESPONDING DIFFRACTION PATTERN IN ELECTRON-MICROSCOPY FOR STRONGLY SCATTERING OBJECTS

被引:10
作者
SCHISKE, P [1 ]
机构
[1] MAX PLANCK GESELL,FRITZ HABER INST,INST ELEKTR MIKROSKOPIE,1 BERLIN,FED REP GER
关键词
D O I
10.1088/0022-3727/8/12/009
中图分类号
O59 [应用物理学];
学科分类号
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页码:1372 / 1386
页数:15
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