STM and AFM analysis of stacked Nb/Al-AlOx/Nb Josephson junctions

被引：0

作者：

Lacquaniti, V

Maggi, S

Monticone, E

Steni, R

Picotto, G

Carnelli, L

Meneghini, G

机构：

[1] CNR,IST METROL G COLONNETTI,I-10135 TURIN,ITALY

[2] CSELT SPA,I-10148 TURIN,ITALY

来源：

APPLIED SUPERCONDUCTIVITY 1995, VOLS. 1 AND 2: VOL 1: PLENARY TALKS AND HIGH CURRENT APPLICATIONS; VOL 2: SMALL SCALE APPLICATIONS | 1995年 / 148卷

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中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Stacks of two and three Nb/Al-AlOx/Nb Josephson junctions have been analyzed by AFM and STM to study the changes in the surface morphology at the different interfaces. We have found that the rms roughness of the Al-AlOx layer is about 1.2 mm and that it is independent of the roughness of the underlying Nb, which varied between 1 and 1.6 mm. On the other hand, the morphology of the Al-AlOx well reproduced the surface features of the base Nb him. The lower measured quality factor of the stacked junctions with respect to single junctions could be ascribed to a different morphology between the base Nb and the subsequent Al-AlOx layers.

引用

页码：1451 / 1454

页数：4

共 4 条

[1] FABRICATION OF HIGH-QUALITY NB/AL/ALOX/NB STACKED JOSEPHSON-JUNCTIONS [J].