SURFACE ANALYSIS WITH HEAVY-ION INDUCED AUGER ELECTRONS

被引：0

作者：

GROENEVELD, KO ^{[1
]}

SPOHR, R ^{[1
]}

机构：

[1] UNIV FRANKFURT, INST KERN PHYS, FRANKFURT, WEST GERMANY

来源：

VAKUUM-TECHNIK | 1974年 / 23卷 / 08期

关键词：

D O I：

暂无

中图分类号：

TH [机械、仪表工业];

学科分类号：

0802 ;

摘要：

引用

页码：225 / 229

页数：5

共 24 条

[1] METHODS OF SURFACE STUDIES DEPENDING ON INELASTIC-SCATTERING OF ELECTRONS [J].

BAUER, E .

VACUUM, 1972, 22 (11) :539-552

[2] ANALYSIS OF SURFACE-LAYERS BY LIGHT ION BACKSCATTERING AND SPUTTERING COMBINED WITH AUGER-ELECTRON SPECTROSCOPY (AES) [J].

BEHRISCH, R ;

SCHERZER, BM ;

STAIB, P .

THIN SOLID FILMS, 1973, 19 (01) :57-67

[3] ANALYSIS OF MONOMOLECULAR LAYERS OF SOLIDS BY SECONDARY ION EMISSION [J].

BENNINGHOVEN, A .

ZEITSCHRIFT FUR PHYSIK, 1970, 230 (05) :403-+

[4]

BRANDT W, 1973, 3 P INT C AT PHYS

[5]

BURCH D, 1973, PHYSICS ELECTRONIC A, P97

[6] CHARACTERISTIC X-RAY PRODUCTION BY HEAVY-ION BOMBARDMENT AS A TECHNIQUE FOR EXAMINATION OF SOLID SURFACES [J].

CAIRNS, JA .

SURFACE SCIENCE, 1973, 34 (03) :638-648

[7]

CROENEVELD KO, 1974, PHYSICA FENNICA S1, V9, P31

[8] COAXIAL-CYLINDER ELECTRON SPECTROMETER FOR BEAM-FOIL EXPERIMENTS [J].

DIETZ, E ;

SPOHR, R ;

STAUDTE, R ;

GROENEVELD, KO .

NUCLEAR INSTRUMENTS & METHODS, 1972, 105 (03) :467-+

[9]

ERTL G, 1974, LOW ENERGY ELECTRONS

[10] PROTON-INDUCED X-RAY-EMISSION AS A TOOL FOR TRACE-ELEMENT ANALYSIS [J].

FOLKMANN, F ;

GAARDE, C ;

HUUS, T ;

KEMP, K .

NUCLEAR INSTRUMENTS & METHODS, 1974, 116 (03) :487-499

← 1 2 3 →