ELECTROOPTIC SAMPLING MEASUREMENT OF MICROWAVE SIGNALS USING A SEMICONDUCTOR-LASER

被引：0

作者：

SUN, W

YI, MB

WANG, YH

LIU, ZS

JIA, G

GAO, DS

机构：

来源：

CHINESE PHYSICS | 1992年 / 12卷 / 04期

关键词：

D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

By using the ultra-fast electro-optic sampling system with temporal resolution as high as 16.7 ps and voltage sensitivity of 0.26 m VHz-1/2 and a 1.3 mum semiconductor laser as the sampling source, microwave signals of 1-5 GHz and the dispersive characteristics of coaxial cables have been studied.

引用

页码：987 / 990

页数：4

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