OSCILLATOR-STRENGTHS OF XEI ELECTRONIC-TRANSITIONS MEASURED BY ELECTRON SPECTROMETRY

被引：34

作者：

DELAGE, A ^{[1
]}

CARETTE, JD ^{[1
]}

机构：

[1] UNIV LAVAL,CTR RECH ATOM & MOLEC,PHYS ATOM & MOLEC LAB,QUEBEC CITY 10,QUEBEC,CANADA

来源：

PHYSICAL REVIEW A | 1976年 / 14卷 / 04期

关键词：

D O I：

10.1103/PhysRevA.14.1345

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：1345 / 1353

页数：9

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