CONVERSE PIEZOELECTRIC EFFECT IN [111] STRAINED-LAYER HETEROSTRUCTURES

被引:23
作者
BAHDER, TB
机构
[1] U.S. Army Research Laboratory, Adelphi, MD 20783
关键词
D O I
10.1103/PhysRevB.51.10892
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Strained-layer heterostructures grown along the [111] crystal direction, such as GaAs-InxGa1-xAs-GaAs, are often embedded in the intrinsic region of a p-i-n diode so that an electric field can be applied during the study of their optical properties. The layers comprising the heterostructure are usually lattice matched to a crystal substrate that provides in-plane mechanical constraints on the heterostructure. We investigate the effect of these constraints on the magnitude of the converse piezoelectric effect in the strained layer. Minimizing the free energy of a strained layer that is in an external electric field and subject to mechanical constraints, we obtain the equation of state for the strained layer that relates the internal electric field to the strain along the [111] growth axis. For the GaAs-InxGa1-xAs-GaAs system grown on a (111) B GaAs substrate, the mechanical constraints on the InxGa1-xAs quantum well decrease the magnitude of the converse piezoelectric effect 24% below that of a free InxGa1-xAs film with the same internal electric field. © 1995 The American Physical Society.
引用
收藏
页码:10892 / 10896
页数:5
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