THE EFFECTS OF ELECTRON-BEAM QUALITY ON THE FREE-ELECTRON LASER MECHANISM

被引：4
作者：
BLAU, J
COLSON, WB
机构：
[1] Physics Department, Naval Postgraduate School, Monterey
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1991年 / 304卷 / 1-3期
关键词：
D O I：
10.1016/0168-9002(91)90902-3
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A characteristic function, the Fourier transform of the electron phase-velocity distribution, is introduced to better understand how electron bunching decays over time due to poor beam quality. Plots of this characteristic function are presented for various types of electron distributions. The free electron laser (FEL) integral equation shows how the time dependence of the characteristic function competes with the laser field's inherent exponential growth rate.
引用
收藏
页码：436 / 438
页数：3
相关论文
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