DIRECT COMPARISON OF FINE-STRUCTURE ON TIL3 THRESHOLD BY DISAPPEARANCE POTENTIAL AND AUGER-ELECTRON AND SOFT-X-RAY APPEARANCE POTENTIAL SPECTROSCOPIES

被引：4

作者：

NISHIMORI, K

TOKUTAKA, H

KOHNO, M

ISHIHARA, N

机构：

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1984年 / 23卷 / 06期

关键词：

D O I：

10.1143/JJAP.23.L366

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：L366 / L368

页数：3

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