MAGNIFICATION VARIATIONS IN REFLECTION ELECTRON-MICROSCOPY USING DIFFRACTED BEAMS

被引：14
|
作者：
COWLEY, JM [1 ]
HOJLUNDNIELSEN, PE [1 ]
机构：
[1] ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281
来源：
ULTRAMICROSCOPY | 1975年 / 1卷 / 02期
关键词：
D O I：
10.1016/S0304-3991(75)80017-9
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：145 / 150
页数：6
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