MAGNIFICATION VARIATIONS IN REFLECTION ELECTRON-MICROSCOPY USING DIFFRACTED BEAMS

被引：14

|

作者：

COWLEY, JM ^{[1
]}

HOJLUNDNIELSEN, PE ^{[1
]}

机构：

[1] ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281

来源：

ULTRAMICROSCOPY | 1975年 / 1卷 / 02期

关键词：

D O I：

10.1016/S0304-3991(75)80017-9

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

收藏

页码：145 / 150

页数：6

相关论文

共 50 条

[1] REFLECTION ELECTRON-MICROSCOPY
YAGI, K
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1987, 20 (03) : 147 - 160
[2] HIGH MAGNIFICATION SCANNING ELECTRON-MICROSCOPY
PETERS, KR
JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1986, 4 (02): : 102 - 113
[3] COMPARISON OF SURFACE STEP IMAGES IN REFLECTION ELECTRON-MICROSCOPY AND SCANNING REFLECTION ELECTRON-MICROSCOPY
BANZHOF, H
HERRMANN, KH
ULTRAMICROSCOPY, 1990, 33 (01) : 23 - 26
[4] HIGH MAGNIFICATION ELECTRON-MICROSCOPY FOR BIOLOGICAL SECTIONS
HIROSAWA, K
JOURNAL OF ELECTRON MICROSCOPY, 1973, 22 (01): : 108 - 108
[5] TECHNIQUE OF REFLECTION ELECTRON-MICROSCOPY
HSU, T
MICROSCOPY RESEARCH AND TECHNIQUE, 1992, 20 (04) : 318 - 332
[6] LOW MAGNIFICATION TRANSMISSION ELECTRON-MICROSCOPY IN DIAGNOSTIC PATHOLOGY
RIPPSTEIN, P
CAVELL, S
BOIVIN, M
DARDICK, I
ULTRASTRUCTURAL PATHOLOGY, 1987, 11 (5-6) : 723 - 729
[7] HIGH-RESOLUTION ELECTRON-MICROSCOPY WITH LOW MAGNIFICATION USING SUPERCONDUCTIVITY LENSES
BAIER, P
KNAPEK, E
OPTIK, 1982, 61 (01): : 99 - 104
[8] SIMULATION TECHNIQUES FOR REFLECTION ELECTRON-MICROSCOPY
ANSTIS, GR
JOURNAL OF METALS, 1988, 40 (11): : 120 - 120
[9] SIMULATION TECHNIQUES FOR REFLECTION ELECTRON-MICROSCOPY
ANSTIS, GR
COMPUTER SIMULATION OF ELECTRON MICROSCOPE DIFFRACTION AND IMAGES, 1989, : 229 - 238
[10] CHARACTERIZATION OF NANOSTRUCTURES BY REFLECTION ELECTRON-MICROSCOPY
SCHERER, A
VANDERGAAG, BP
APPLIED PHYSICS LETTERS, 1990, 56 (25) : 2566 - 2568

← 1 2 3 4 5 →