CRYSTALLOGRAPHIC CONTRAST DUE TO PRIMARY ION CHANNELING IN THE SCANNING ION-MICROSCOPE

被引：15

作者：

LAMARCHE, PH ^{[1
]}

LEVISETTI, R ^{[1
]}

LAM, K ^{[1
]}

机构：

[1] UNIV CHICAGO,ENRICO FERMI INST,CHICAGO,IL 60637

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1983年 / 30卷 / 02期

关键词：

D O I：

10.1109/TNS.1983.4332498

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1240 / 1242

页数：3

共 18 条

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[7] DIRECT AND RECOIL-INDUCED ELECTRON-EMISSION FROM ION-BOMBARDED SOLIDS [J].

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PHYSICAL REVIEW B, 1979, 20 (06) :2247-2254

[8]

LEVISETTI R, NUCL INST METHODS

[9]

Lindhard J, 1965, K DAN VIDENSK SELSK, V34

[10]

Lindhard J., 1963, MAT FYS MEDD K DAN V, V33, P31

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