Contrast of Electron Microscopy Images of Amorphous Objects

被引：0

作者：

Svatiuk, O. Ya. ^{[1
]}

机构：

[1] Uzhgorod Natl Univ, 46 Pidhirna St, UA-88000 Uzhgorod, Ukraine

来源：

JOURNAL OF NANO- AND ELECTRONIC PHYSICS | 2016年 / 8卷 / 01期

关键词：

Electron microscopy; Electron diffraction; Amplitude contrast; Amorphous material; Microstructure;

D O I：

10.21272/jnep.8(1).01005

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

It has been proposed to determine the contrast in electron microscopy image via the total electron fluxes scattered beyond the aperture diaphragm by local areas of the object under study to analyze quantitatively the amplitude (absorption) contrast of the amorphous objects with different types of heterogeneities of the atomic and continual structure. The significant properties of the determined contrast are its linear dependence on the difference of electron beam fluxes that form the image and a convenient range of variation from 0 to 1 relative units.

引用

页数：7

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