A PIXE-PIGE SETUP FOR THE ANALYSIS OF THIN SAMPLES

被引：25
作者：
BONI, C [1 ]
CARIDI, A [1 ]
CEREDA, E [1 ]
MARCAZZAN, GMB [1 ]
机构：
[1] UNIV MILAN,IST FIS GEN APPL,I-20122 MILAN,ITALY
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1990年 / 47卷 / 02期
关键词：
D O I：
10.1016/0168-583X(90)90021-L
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
The combined and simultaneous use of PIXE (particle induced X-ray emission) and PIGE (proton induced gamma-ray emission) techniques for the analysis of thin samples is presented. In the Cise PIXE-PIGE setup, the difficulties associated with fluctuations in the prompt gamma reaction yields have been overcome by using an energy spread proton beam. Our setup can be applied to the analysis of thin samples of interest to many research fields ranging from medicine to art. The general features of the system and examples of applications to materials, aerosol and coal sciences are presented. © 1990.
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页码：133 / 142
页数：10
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