2-1/2D ELECTRON-MICROSCOPY - THROUGH-FOCUS DARK-FIELD IMAGE SHIFTS

被引：42
作者：
BELL, WL [1 ]
机构：
[1] GE VALLECITOS NUCL CTR,PLEASANTON,CA 94566
来源：
JOURNAL OF APPLIED PHYSICS | 1976年 / 47卷 / 04期
关键词：
D O I：
10.1063/1.322766
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：1676 / 1682
页数：7
相关论文
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