EDDY-CURRENT PROBE IMPEDANCE DUE TO A SURFACE SLOT IN A CONDUCTOR

被引：10

作者：

BOWLER, JR ^{[1
]}

SABBAGH, LD ^{[1
]}

SABBAGH, HA ^{[1
]}

机构：

[1] SABBAGH ASSOCIATES INC,BLOOMINGTON,IN 47401

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1990年 / 26卷 / 02期

关键词：

D O I：

10.1109/20.106460

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A computational model has been developed for the simulation of eddy-current nondestructive testing. The electric field produced by a probe in the absence of the flaw is determined; then the field induced at the flaw is found. These field calculations are based on volume integral techniques requiring only the region of the scatterer to be discretized. Boundary conditions at infinity and interface conditions at the surface of the conductor are built into the Green's function kernels, thus ensuring that the scattered field satisfies these conditions. The discrete equations are formed using the method of moments and solved using conjugate gradient methods. © 1990, IEEE. All rights reserved.

引用

页码：889 / 892

页数：4

共 4 条

[1] A THEORETICAL AND COMPUTATIONAL MODEL OF EDDY-CURRENT PROBES INCORPORATING VOLUME INTEGRAL AND CONJUGATE-GRADIENT METHODS [J].