ALGORITHMS AND SOFTWARE TOOLS FOR IC YIELD OPTIMIZATION BASED ON FUNDAMENTAL FABRICATION PARAMETERS

被引：42
作者：
STYBLINSKI, MA
OPALSKI, LJ
机构：
来源：
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 1986年 / 5卷 / 01期
关键词：
D O I：
10.1109/TCAD.1986.1270179
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：79 / 89
页数：11
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