ELASTIC RELAXATION IN TRANSMISSION ELECTRON-MICROSCOPY OF STRAINED-LAYER SUPERLATTICES

被引:53
作者
GIBSON, JM [1 ]
HULL, R [1 ]
BEAN, JC [1 ]
TREACY, MMJ [1 ]
机构
[1] EXXON RES & ENGN CO,ANNANDALE,NJ 08801
关键词
D O I
10.1063/1.95516
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
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页码:649 / 651
页数:3
相关论文
共 11 条
[1]   TRANSMISSION ELECTRON-MICROSCOPE IMAGE-CONTRAST OF EPITAXIAL INTERFACES WITH SMALL MISFITS [J].
AURET, FD ;
BALL, CAB ;
SNYMAN, HC .
THIN SOLID FILMS, 1979, 61 (03) :289-295
[2]   DIRECT OBSERVATION OF LATTICE DISTORTION IN A STRAINED-LAYER SUPER-LATTICE [J].
BROWN, JM ;
HOLONYAK, N ;
LUDOWISE, MJ ;
DIETZE, WT ;
LEWIS, CR .
APPLIED PHYSICS LETTERS, 1983, 43 (09) :863-865
[3]   EFFECT OF LAYER SIZE ON LATTICE DISTORTION IN STRAINED-LAYER SUPERLATTICES [J].
BROWN, JM ;
HOLONYAK, N ;
KALISKI, RW ;
LUDOWISE, MJ ;
DIETZE, WT ;
LEWIS, CR .
APPLIED PHYSICS LETTERS, 1984, 44 (12) :1158-1160
[4]   COMMENSURATE AND INCOMMENSURATE STRUCTURES IN MOLECULAR-BEAM EPITAXIALLY GROWN GEXSI1-X FILMS ON SI(100) [J].
FIORY, AT ;
BEAN, JC ;
FELDMAN, LC ;
ROBINSON, IK .
JOURNAL OF APPLIED PHYSICS, 1984, 56 (04) :1227-1229
[5]   THE EFFECT OF ELASTIC RELAXATION ON THE LOCAL-STRUCTURE OF LATTICE-MODULATED THIN-FILMS [J].
GIBSON, JM ;
TREACY, MMJ .
ULTRAMICROSCOPY, 1984, 14 (04) :345-349
[6]   STRUCTURE IMAGING OF COMMENSURATE GEXSI1-X/SI(100) INTERFACES AND SUPERLATTICES [J].
HULL, R ;
GIBSON, JM ;
BEAN, JC .
APPLIED PHYSICS LETTERS, 1985, 46 (02) :179-181
[7]  
MATTHEWS JW, 1974, J CRYST GROWTH, V27, P118, DOI 10.1016/S0022-0248(74)80055-2
[8]   DEFECTS IN EPITAXIAL MULTILAYERS .2. DISLOCATION PILE-UPS, THREADING DISLOCATIONS, SLIP LINES AND CRACKS [J].
MATTHEWS, JW ;
BLAKESLEE, AE .
JOURNAL OF CRYSTAL GROWTH, 1975, 29 (03) :273-280
[9]  
OSBOURN GC, 1982, J APPL PHYS, V53, P1587
[10]   STRAIN-MEASUREMENTS BY CHANNELING ANGULAR SCANS [J].
PICRAUX, ST ;
DAWSON, LR ;
OSBOURN, GC ;
BIEFELD, RM ;
CHU, WK .
APPLIED PHYSICS LETTERS, 1983, 43 (11) :1020-1022