BASIC RESEARCH NEEDS AND OPPORTUNITIES FOR CHARACTERIZING THE MICROSTRUCTURE AND MICROCHEMISTRY OF INTERFACES

被引：6
作者：
SILCOX, J
HOLLOWAY, PH
LAWLESS, KR
LICHTMAN, D
MEISENHEIMER, RG
MURR, LE
POWELL, CJ
机构：
[1] UNIV FLORIDA,DEPT MAT SCI & ENGN,GAINESVILLE,FL 32611
[2] UNIV VIRGINIA,DEPT MAT SCI,CHARLOTTESVILLE,VA 22901
[3] UNIV WISCONSIN,DEPT PHYS,MILWAUKEE,WI 53201
[4] UNIV WISCONSIN,SURFACE STUDIES LAB,MILWAUKEE,WI 53201
[5] UNIV CALIF LAWRENCE LIVERMORE NATL LAB,LIVERMORE,CA 94550
[6] OREGON GRAD CTR,BEAVERTON,OR 97006
[7] NBS,DIV SURFACE SCI,WASHINGTON,DC 20234
来源：
MATERIALS SCIENCE AND ENGINEERING | 1982年 / 53卷 / 01期
关键词：
D O I：
10.1016/0025-5416(82)90019-2
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：149 / 162
页数：14
相关论文
共 11 条
[1]   BASIC RESEARCH NEEDS AND OPPORTUNITIES AT THE SOLID SOLID INTERFACE - DIFFUSION [J].
BALLUFFI, RW ;
DUKE, CB ;
KAZMERSKI, LL ;
MITCHELL, KW ;
REIFENBERGER, R ;
WOOD, RF .
MATERIALS SCIENCE AND ENGINEERING, 1982, 53 (01) :93-102
[2]   A SIMPLE SCANNING ELECTRON MICROSCOPE [J].
CREWE, AV ;
ISAACSON, M ;
JOHNSON, D .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1969, 40 (02) :241-&
[3]  
Czanderna A.W., 1975, METHODS SURFACE ANAL
[4]  
CZANDERNA AW, 1980, SOLAR MATERIALS SCI, pCH3
[5]  
GOLDSTEIN SI, 1979, INTRO ANAL ELECTRON
[6]   LIMITATIONS OF ION ETCHING FOR INTERFACE ANALYSIS [J].
HOLLOWAY, PH ;
BHATTACHARYA, RS .
MATERIALS SCIENCE AND ENGINEERING, 1982, 53 (01) :81-91
[7]  
JOUFFREY B, 1978, ELECTRON MICROS, V3, P292
[8]   HIGH-RESOLUTION ELECTRON-MICROSCOPY STUDY OF SI-SIO2 INTERFACE [J].
KRIVANEK, OL ;
SHENG, TT ;
TSUI, DC .
APPLIED PHYSICS LETTERS, 1978, 32 (07) :437-439
[9]   REFLECTION ELECTRON-MICROSCOPE OBSERVATIONS OF DISLOCATIONS AND SURFACE-STRUCTURE PHASE-TRANSITION ON CLEAN (111) SILICON SURFACES [J].
OSAKABE, N ;
YAGI, K ;
HONJO, G .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1980, 19 (06) :L309-L312
[10]  
PORTER JR, 1977, IRONMAK STEELMAK, V4, P300
12