LEAKY SAW VELOCITY ON WATER SILICON BOUNDARY MEASURED BY ACOUSTIC LINE-FOCUS BEAM

被引：13

作者：

KUSHIBIKI, J

HORII, K

CHUBACHI, N

机构：

来源：

ELECTRONICS LETTERS | 1982年 / 18卷 / 17期

关键词：

D O I：

10.1049/el:19820497

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：732 / 734

页数：3

共 12 条

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[3] THEORETICAL-ANALYSIS FOR V(Z) CURVES OBTAINED BY ACOUSTIC MICROSCOPE WITH LINE-FOCUS BEAM [J].

KUSHIBIKI, J ;

OHKUBO, A ;

CHUBACHI, N .

ELECTRONICS LETTERS, 1982, 18 (15) :663-664

[4] EFFECT OF LEAKY SAW PARAMETERS ON V(Z) CURVES OBTAINED BY ACOUSTIC MICROSCOPY [J].

KUSHIBIKI, J ;

OHKUBO, A ;

CHUBACHI, N .

ELECTRONICS LETTERS, 1982, 18 (15) :668-670

[5] ANISOTROPY DETECTION IN SAPPHIRE BY ACOUSTIC MICROSCOPE USING LINE-FOCUS BEAM [J].

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OHKUBO, A ;

CHUBACHI, N .

ELECTRONICS LETTERS, 1981, 17 (15) :534-536

[6] PROPAGATION CHARACTERISTICS OF LEAKY SAWS ON WATER LINBO3 BOUNDARY MEASURED BY ACOUSTIC MICROSCOPE WITH LINE-FOCUS BEAM [J].

KUSHIBIKI, J ;

OHKUBO, A ;

CHUBACHI, N .

ELECTRONICS LETTERS, 1982, 18 (01) :6-7

[7]

Kushibiki J., 1981, P IEEE ULTRASONICS S, P552

[8] ACOUSTIC SURFACE WAVES ON SILICON [J].

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[9] ACOUSTIC MICROSCOPY WITH MECHANICAL SCANNING - REVIEW [J].

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[10]

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