X-RAY STRUCTURAL CHARACTERIZATION OF CDS FILMS GROWN UNDER LONGITUDINAL ELECTRIC-FIELD

被引:2
作者
LAL, P
机构
[1] Univ of Zambia, Lusaka, Zambia, Univ of Zambia, Lusaka, Zambia
关键词
ELECTRIC FIELD EFFECTS - SEMICONDUCTING FILMS - Growth - X-RAY ANALYSIS;
D O I
10.1007/BF01739279
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Thin films of cadmium sulfide sandwiched between aluminium electrodes were deposited at fields of plus or minus 35, plus or minus 65 and plus or minus 106 v cm** minus **1. This study suggests that the conductivity of the compound semiconductors which have a certain degree of ionicity may be controlled by optimizing the electric field at the time of film growth. Electrical quenching at the time of deposition under the influence of a dc longitudinal electric field is responsible for the missing or diffused lines in the x-ray diffraction pattern.
引用
收藏
页码:546 / 548
页数:3
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