THE X-RAY TOPOGRAPHY STATION AT DARESBURY LABORATORY

被引：44

作者：

BOWEN, DK

CLARK, GF

DAVIES, ST

NICHOLSON, JRS

ROBERTS, KJ

SHERWOOD, JN

TANNER, BK

机构：

[1] UNIV STRATHCLYDE,DEPT APPL CHEM,GLASGOW G1 1XW,SCOTLAND

[2] UNIV DURHAM,DEPT PHYS,DURHAM DH1 3HP,ENGLAND

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1982年 / 195卷 / 1-2期

关键词：

D O I：

10.1016/0029-554X(82)90784-4

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：277 / 284

页数：8

共 18 条

[1]

Bowen D. K., 1980, Characterization of Crystal Growth Defects by X-Ray Methods. Proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-Ray Methods, P506

[2] TENSILE STAGE FOR X-RAY TOPOGRAPHY [J].

BOWEN, DK ;

MILTAT, J .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1976, 9 (10) :868-870

[3] EVIDENCE OF INTERACTIONS BETWEEN DOMAIN-WALLS AND A DISLOCATION BUNDLE IN SYNCHROTRON X-RADIATION TOPOGRAPHS OF IRON WHISKER CRYSTALS [J].

CHIKAURA, Y ;

TANNER, BK .

JAPANESE JOURNAL OF APPLIED PHYSICS, 1979, 18 (07) :1389-1390

[4]

Chikawa J., 1980, Characterization of Crystal Growth Defects by X-Ray Methods. Proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-Ray Methods, P368

[5] X-RAY TOPOGRAPHIC ASSESSMENT OF FLUX-GROWN CRYSTALS OF RARE-EARTH GERMANATES (R2GE2O7) [J].

CLARK, GF ;

TANNER, BK ;

WANKLYN, BM .

JOURNAL OF MATERIALS SCIENCE, 1980, 15 (05) :1328-1330

[6]

Hart M., 1980, Characterization of Crystal Growth Defects by X-Ray Methods. Proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-Ray Methods, P421

[7] FLUORESCENT SCREENS FOR HIGH-RESOLUTION REAL-TIME X-RAY TOPOGRAPHY [J].

HARTMANN, W .

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1981, 128 (03) :568-570

[8]

Hartmann W., 1980, Characterization of Crystal Growth Defects by X-Ray Methods. Proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-Ray Methods, P497

[9] APPLICATION OF X-RAY SYNCHROTRON TOPOGRAPHY TO INSITU STUDIES OF RECRYSTALLIZATION [J].

MACCORMACK, IB ;

TANNER, BK .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1978, 11 (FEB) :40-43

[10]

MACCORMACK IB, 1981, IEEE T MAGNETICS P I

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