CALCULATION OF THE SYSTEM FOCUSING ELECTRON BEAM IN THE ION SOURCE OF MASS SPECTROMETER WITH ELECTRON IMPACT IONIZATION

被引：0

作者：

Kuzema, O. S. ^{[1
]}

Kuzema, P. O. ^{[2
]}

机构：

[1] Sumy Natl Agrarian Univ, 160,Kirov Str, UA-40021 Sumy, Ukraine

[2] NAS Ukraine, Chuiko Inst Surface Chem, UA-03164 Kiev, Ukraine

来源：

JOURNAL OF NANO- AND ELECTRONIC PHYSICS | 2011年 / 3卷 / 03期

关键词：

MASS SPECTROMETER; ION SOURCE; IONIZATION CHAMBER; MAGNETIC FIELD; ELECTRON BEAM;

D O I：

暂无

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

It has been found the correlations for the parameters of electron movement and it has been determined the value for magnetic induction in the region of ionization chamber providing the electron beam passage through the space of ionization chamber without its broadening.

引用

页码：85 / 89

页数：5