TERAHERTZ RADIATION FROM DELTA-DOPED GAAS

被引:12
作者
BIRKEDAL, D
HANSEN, O
SORENSEN, CB
JARASIUNAS, K
BRORSON, SD
KEIDING, SR
机构
[1] NIELS BOHR INST,ORSTED LAB,DK-2100 COPENHAGEN,DENMARK
[2] ODENSE UNIV,INST FYS,DK-5230 ODENSE,DENMARK
[3] VILNIUS UNIV,DEPT SEMICOND PHYS,VILNIUS,LITHUANIA
关键词
D O I
10.1063/1.113080
中图分类号
O59 [应用物理学];
学科分类号
摘要
Terahertz pulse emission from four different delta-doped molecular beam epitaxially grown GaAs samples is studied. We observe a decrease of the emitted THz pulse amplitude as the distance of the delta-doped layer from the surface is increased, and a change in polarity of the THz pulses as compared to bulk n-type doped GaAs reference samples. The electric fields in the region of the doping layer are investigated by photoreflectance spectroscopy. A careful analysis of Franz-Keldysh oscillations observed in the photoreflectance spectra provides information about the built-in fields on both sides of the delta-doped layer.
引用
收藏
页码:79 / 81
页数:3
相关论文
共 6 条
[1]   SCHOTTKY-BARRIER ELECTROREFLECTANCE-APPLICATION TO GAAS [J].
ASPNNES, DE ;
STUDNA, AA .
PHYSICAL REVIEW B, 1973, 7 (10) :4605-4652
[2]   PHOTOREFLECTANCE SPECTROSCOPY OF MICROSTRUCTURES [J].
GLEMBOCKI, OJ ;
SHANABROOK, BV .
SPECTROSCOPY OF SEMICONDUCTORS, 1992, 36 :221-292
[3]   FRANZ-KELDYSH OSCILLATIONS OF DELTA-DOPED GAAS [J].
HSU, TM ;
TIEN, YC ;
LU, NH ;
TSAI, SP ;
LIU, DG ;
LEE, CP .
JOURNAL OF APPLIED PHYSICS, 1992, 72 (03) :1065-1069
[4]   PHOTOREFLECTION STUDY ON THE SURFACE ELECTRIC-FIELD OF DELTA-DOPED GAAS GROWN BY MOLECULAR-BEAM EPITAXY [J].
LIU, DG ;
CHANG, KH ;
LEE, CP ;
HSU, TM ;
TIEN, YC .
JOURNAL OF APPLIED PHYSICS, 1992, 72 (04) :1468-1472
[5]  
PEDERSEN JE, 1992, APPL PHYS LETT, V62, P1392
[6]   OPTOELECTRONIC MEASUREMENT OF SEMICONDUCTOR SURFACES AND INTERFACES WITH FEMTOSECOND OPTICS [J].
ZHANG, XC ;
AUSTON, DH .
JOURNAL OF APPLIED PHYSICS, 1992, 71 (01) :326-338