MAGNETIC FORCE MICROSCOPY OF MAGNETIC-MATERIALS

被引：30

作者：

GRUTTER, P ^{[1
]}

RUGAR, D ^{[1
]}

MAMIN, HJ ^{[1
]}

机构：

[1] IBM CORP,DIV RES,ALMADEN RES CTR,SAN JOSE,CA 95120

来源：

ULTRAMICROSCOPY | 1992年 / 47卷 / 04期

关键词：

D O I：

10.1016/0304-3991(92)90170-O

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

In this paper we give a brief summary of the basic principles of MFM. Some typical experimental results are discussed to demonstrate the potential, limitations and future perspectives of this technique.

引用

页码：393 / 399

页数：7

共 41 条

[1] FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY [J].

ALBRECHT, TR ;

GRUTTER, P ;

HORNE, D ;

RUGAR, D .

JOURNAL OF APPLIED PHYSICS, 1991, 69 (02) :668-673

[2] COMPACT, COMBINED SCANNING TUNNELING FORCE MICROSCOPE [J].

ANSELMETTI, D ;

GERBER, C ;

MICHEL, B ;

GUNTHERODT, HJ ;

ROHRER, H .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (05) :3003-3006

[3] OBSERVATION OF RECORDED TRACKS IN CO-CR MEDIA BY MAGNETIC FORCE MICROSCOPY [J].

BERNARDS, JPC ;

DENBOEF, AJ .

IEEE TRANSACTIONS ON MAGNETICS, 1990, 26 (05) :1515-1517

[4] ATOMIC FORCE MICROSCOPE [J].

BINNIG, G ;

QUATE, CF ;

GERBER, C .

PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933

[5]

Brown Jr W. F., 1962, MAGNETOSTATIC PRINCI

[6] PREPARATION OF MAGNETIC TIPS FOR A SCANNING FORCE MICROSCOPE [J].

DENBOEF, AJ .

APPLIED PHYSICS LETTERS, 1990, 56 (20) :2045-2047

[7] SCANNING FORCE MICROSCOPY USING A SIMPLE LOW-NOISE INTERFEROMETER [J].

DENBOEF, AJ .

APPLIED PHYSICS LETTERS, 1989, 55 (05) :439-441

[8] OBSERVATION OF THE SWITCHING FIELDS OF INDIVIDUAL PERMALLOY PARTICLES IN NANOLITHOGRAPHIC ARRAYS VIA MAGNETIC FORCE MICROSCOPY [J].

GIBSON, GA ;

SMYTH, JF ;

SCHULTZ, S ;

KERN, DP .

IEEE TRANSACTIONS ON MAGNETICS, 1991, 27 (06) :5187-5189

[9]

GODDENHENRICH T, 1988, J MICROSC-OXFORD, V152, P527

[10]

GODDENHENRICH T, 1990, J VAC SCI TECHNOL A, V8, P383, DOI 10.1116/1.576401

← 1 2 3 4 5 →