EVALUATION OF THE ARMSTRONG-BUSECK CORRECTION FOR AUTOMATED ELECTRON-PROBE X-RAY-MICROANALYSIS OF PARTICLES

被引：15
作者：
STORMS, HM
JANSSENS, KH
TOROK, SB
VANGRIEKEN, RE
机构：
来源：
X-RAY SPECTROMETRY | 1989年 / 18卷 / 02期
关键词：
D O I：
10.1002/xrs.1300180203
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
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页码：45 / 52
页数：8
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